GD32F103 — 16-CAN自回环测试

来源: DRG GD-1 开发板例程
源文件: GD32/drg_gd_1_gd32f103c8t6-master/16-CAN自回环测试/test/APP/main.c

子模块

Firmware
test

关键代码

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#include <stdio.h>
#include "systick.h"
#include "i2c.h"
#include "oled_i2c.h"
#include "can_test.h"

int main(){
	systick_config();
	i2c_init();
	
	oled_init();
	oled_clear_all();
	oled_show_string(24, 0, (uint8_t *)"CAN Test", 16);
	
//	can_nvic_config();

	while(1){
		can_loopback_test();   //canշݵĲ
		
		/* ʾԵĽ */
		if(can_test_flag == SUCCESS){// ɹ
			oled_show_string(2, 2, (uint8_t *)"can test success.", 8);	// ʾɹ
		}else{		// 
		    oled_show_string(2, 2, (uint8_t *)"can test error.   ", 8);      // ʾʧ
		}
		
		delay_1ms(3000);  //ȴ1s
		
//		can_loopback_interr_test();
//		
//		/* ʾжʽcanյĲԽ */
//		if(can_test_flag_interrupt == SUCCESS){// ɹ
//			oled_show_string(2, 3, (uint8_t *)"can interrupt test success.", 8);	// ʾɹ
//		}else{		// 
//		    oled_show_string(2, 3, (uint8_t *)"can interrupt test error.", 8);      // ʾʧ
//		}
//		
//		delay_1ms(3000);
	}
}